L. . Ghalmi, S. . Bensmaine, and C. E. H. . Merzouk, “Structural Characterization of ZnO Thin Films Deposited onto Silicon Substrates using Cathodic Magnetron Sputtering”, J. Ren. Energies, vol. 26, no. 1, pp. 41 – 56, Jun. 2023, doi: 10.54966/jreen.v26i1.1116.