Bouhafs D, Khelifati N, Boucheham A, Palahouane B. Adequate method to study the surface passivation effectiveness in HEM multicristallin silicon wafers. J. Ren. Energies [Internet]. 2015 Mar. 31 [cited 2025 Jul. 26];18(1):1 – 8. Available from: http://revue.cder.dz/index.php/rer/article/view/480